With advanced analytical capabilities, the enables atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis. The JEM-ARM200F offers the ultimate stability for imaging and analysis at the sub-nanometer scale.To learn more about how the JEOL JEM-ARM200F has revolutionized TEM with the best atomic level imaging and chemical mapping available, or for a bibliography of papers and proceedings published on the JEOL Cs corrected TEM, please complete the form below.
The Research Complex at Harwell is a joint initiative of the Research Councils (BBSRC, EPSRC, MRC, NERC and STFC) and the Diamond Light Source, providing state-of-the-art multidisciplinary research laboratories on the Rutherford Appleton Laboratory (RAL) site adjacent to the new Diamond third generation synchrotron source. The Complex was opened in 2010, providing approximately 6500 m2 gross floor area. It is managed by MRC on behalf of the other partners. The Complex currently has a core staff of 16 to run the facility, and can accommodate up to 150 physical and life scientists who will be funded by external grants to carry out cutting edge multidisciplinary research. The MRC is a great place to work and progress your career, be it in scientific research or the support functions.The MRC is a unique working environment where our researchers are rewarded by world class innovation and collaboration opportunities that the MRC name brings.
'NEOARM' / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV.' NEOARM' is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging.Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit. Contrast enhancement of light elements is achieved by a new STEM imaging technique (e-ABF: enhanced ABF), facilitating observation of light-element materials, even at low accelerating voltages.The microscope room is separated from the operation room to respond to a remote operation. In addition, JEOL products’ new concept colors of 'pure white' and 'JEOL silver' are adopted, leading to a sophisticated exterior design of 'NEOARM'.
Spherical aberration (Cs) corrector ASCOR (Advanced STEM Corrector)ASCOR incorporated in 'NEOARM' can suppress the six-fold astigmatism which limits resolution after Cs correction. The combination of ASCOR and Cold FEG gives low chromatic aberration and expands the diffraction limit, achieving higher resolution than ever. Automatic aberration correction software JEOL COSMO™(Corrector System Module)JEOL COSMO™ adopts a new aberration correction algorithm (SRAM: Segmented Ronchigram Auto-correlation function Matrix).
Thus, no special sample is required for aberration correction, leading to high-precision and quick correction of higher order aberrations. This system enables fast processing compared to the conventional correction algorithm and also automates the operations, thus eliminating a complicated correction workflow in the customer microscope. These features enable higher-throughput atomic-resolution imaging. New ABF (Annular Bright Field) detector systemThe ABF detector is widely used as a technique suitable for high-resolution imaging of light elements. 'NEOARM' supports enhanced contrast of light elements by a newly-designed ABF imaging technique (e-ABF:enhanced ABF). This capability facilitates atomic-level structure observation of materials containing light elements.
Jeol Arm200f Manual Dexterity System
Perfect sight detectorThe perfect sight detector, integrated into 'NEOARM', uses hybrid scintillators. This detector always enables the acquisition of high-contrast and quantitative STEM images, irrespective of accelerating voltage settings. Viewing Camera system'NEOARM' comes with the Viewing Camera system.
Jeol Arm200f Manual Dexterity Pdf
This image observation system uses a dual camera, intended to be used for remote operations. Thus, the system allows for the remote operations in a room separated from the microscope room and also enables a flexible operation environment. In addition, the NEOARM adopts JEOL products’ new concept colors of 'pure white' and 'JEOL silver' for a sophisticated exterior design. Link. News ReleaseCatalogue Download.